Our new JASCO FT-IR system is now fully commissioned and available for use. The system provides incredible signal to noise performance, allowing analysis of incredibly small quantities of material. Our system includes the Bio-Rad Laboratories Informatics Division search software package providing instant access to over 250,000 reference materials. Our system find applications across all industry sectors for unknown material identification, material quality control and semiconductor layer thickness measurement.
MCS also offer a free-of-charge custom database service. We’ll build a database of your process / product materials and hold permanently for your future reference.
Call or e-mail for further information.